Mettler-Toledo Product Inspection has launched the X56 DXD+, a new dual-energy photon-counting x-ray inspection system designed to improve the detection of low-density contaminants in packaged food products. The system expands the company’s X6 Series portfolio and is aimed at manufacturers processing medium and large packaged products on single lanes, as well as smaller packs running across multiple lanes.

The launch reflects growing industry demand for inspection technologies capable of identifying increasingly difficult contaminants while maintaining high throughput and compliance standards. According to Mettler-Toledo, the X56 DXD+ is particularly suited to applications where conventional single-energy x-ray systems may struggle, including products with varying thicknesses, densities or overlapping textures. Examples cited by the company include pet food, potato products and bags of crisps.

At the core of the new system is the combination of DXD+ detector technology and the company’s Advanced Material Discrimination Pro (AMD Pro) software. Together, these technologies are designed to enhance the detection of low-density contaminants such as rubber and plastics, materials that can be difficult to identify using traditional inspection methods. The company says the technology maintains high sensitivity levels even when inspecting products that generate significant image noise or contain complex structures.

The X56 DXD+ joins the existing X16 and X36.2 models within the X6 Series. While the X16 is positioned for high-speed inspection of individual packages and the X36.2 offers customizable configurations for more advanced and high-throughput production environments, the new system fills a gap for medium-to-large packaged applications requiring dual-energy photon-counting capabilities within a 500 mm inspection width.

Artificial intelligence also plays a central role in the new platform. Mettler-Toledo has integrated AI-driven inspection capabilities intended to improve the reliability of quality control tasks while reducing unnecessary product rejects. The company notes that AI can help address challenging inspection situations involving overlapping products or mixed product presentations, potentially improving overall production efficiency. The AI functionality is not limited to the X56 DXD+ and is available across other x-ray inspection systems within the company’s portfolio.

Beyond contamination detection, the X56 DXD+ incorporates a range of product quality inspection functions. These include completeness checks, clip detection and the identification of product trapped within package seals. Such capabilities allow processors to use the system for broader quality assurance objectives while helping to protect brand reputation and product consistency.

Operational efficiency was another focus during development. The system features an intuitive user interface, tool-free belt removal for cleaning and a hygienic design intended for high-speed production environments. Mettler-Toledo states that the X56 DXD+ can process up to 500 products per minute, enabling manufacturers to maintain productivity while addressing rising operational costs and labor pressures.

To support a wide range of production environments, the new system is available in both single-lane and multi-lane configurations and can be integrated with various conveyor heights and reject mechanisms. The platform also provides image recording and traceability capabilities, allowing inspection data to be reviewed directly on the system or managed centrally through Mettler-Toledo’s ProdX™ data management software.

The company says the integration with ProdX™ enables automated monitoring, reporting and collection of inspection data in real time, supporting regulatory compliance and audit readiness while providing manufacturers with additional operational insights. Secure data storage and compatibility with common network protocols are intended to facilitate centralized quality management across global production operations.

Chris Plant, Head of Market Management, Mettler-Toledo Safeline X-ray, said: “The launch of the X56 DXD+ expands our X6 Series, offering a comprehensive suite of inspection solutions tailored to modern food manufacturing. With its dual energy photon-counting capabilities, the X56 DXD+ delivers new levels of detection performance in complex packages across single and multi-lane formats. This advanced inspection capability will further help customers inspect every product with confidence, protect productivity, brand reputations and profits, plus comply easily with industry requirements.”